The IEEE NJ Section Electron Devices, Circuits and Systems Chapter and NJIT will host  "Photocurrent and Noise Analysis as Alternative Approaches to Understanding OFET Behavior" on Nov. 10 at 5 p.m. in Room 202, ECE Center. The speaker will be John Kymissis, PhD of Columbia University. All are welcome. You do not have to be a member of the IEEE to attend. Contact: Durga Misra at 973-596-5739 or Edip Niver at 973-596-3542.