Distinguished Professor at New Jersey Institute of Technology Receives International Award
Savir received the Teruhiko Yamada Memorial Award during the recent Asian Test Symposium of the Test Technology Technical Council of the Institute of Electrical and Electronics Engineering (IEEE) Computer Society. Savir, a resident of Mahopac, NY, received the award during the 10th anniversary of the conferences held in Kyoto, Japan.
"Although the symposium is called Asian, it is actually a gathering of world experts in computer engineering, especially in the testing of computer chip design," says S.T. Mau, dean of the Newark College of Engineering at NJIT.
"The work that led to this award has been my contributions to test technology," says Savir, a former industrial scientist with IBM. Test technology is an area in electrical and computer engineering that finds ways to detect manufacturing faults in digital circuits. It also searches for innovative ways to make a design more testable, methodology that will allow a digital circuit to test itself and more efficient simulation techniques to determine which faults are detected by a given test. Savir is also known for his work in computer-aided design.
Savir is a well-published author. Since 1992, electrical engineering journals such as the Journal of Electronic Testing and scholarly journals of the Institute for Electrical and Electronics Engineering have published 19 of his papers.
Savir holds four patents in the field of test technology. The patents were issued between 1994 and 1997. A fellow of the Institute of Electrical and Electronic Engineering, he received his bachelor's degree from Technion, the Israel Institute of Technology, two masters' degrees from Technion and Stanford University and his doctorate also from Stanford University.
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and Liberal Arts, School of Management, Albert Dorman Honors College and College of
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